X-RAY EQUIPMENT

We can take measurements of small pieces with different forms, for example screws, nuts or bolts.
The maximum sample measurement is 25 x 20 x 28 mm

Our instrument covers a wide range of elements generally between atomic number 22 (Titanium) up to that of uranium (Z = 92), to the noble gas exceptions, and is capable of measuring concentrations of between about 0.1 and 100 percent.

The X-Ray Fluorescence (XRF) is an established analytical technique, fast and reliable, and able to determine, with a high degree of accuracy, the elemental composition of a sample. The sample is introduced inside the measuring chamber and excited with primary X-rays.

The operating principle is based initially in directing primary X radiatio­n against the sample material. Such primary radiation is generated by an X-ray tube and is concentrated by a collimator so as to be able to select with precision the size of the relevant measuring point as a function of measurements to be performed. The excitement concerns electrons closest to the core which are, if hit by with adequate energy radiation, ejected from the atom. Interacting with orbital interior of atoms, the state of oxidation and chemical element bonds do not affect the analysis. Furthermore, the transpa­rency of the aperture diaphragm allows us to check the measu­ring point by means of a video camera, thanks to a technical solution (paten­ted) which involves the particular arrangement of a mirror with hole.  The primary X-ray radiation in turn generates the characteristic secondary XRF radiation on the surface of the sample, by ensuring that each element emits a whole sequence of energy pulses. A differentiation is made between the K and L series (in this case the M series has little relevance) depending on whether the primary radiation ionizes the respective atom in the K or L layer. A GM counter (detector) then measures the secondary radiation, after which the computer evaluates the spectral pulses thus obtained and processes the measurement results.

The XRF exploit the principle of energy dispersion, where the detector registers the energy composition (spectrum) of the fluorescence radiation, which is characteristic of each element. In the acquisition of the spectrum, the energy peaks are well identified, making possible the determination of the elements constituting the test material. The rows of Kα emission, Kβ, Lα, corresponding to the relative atomic energy levels starting from the innermost shell, are of the order of tens of keV.

In recent years, thanks to the development of increasingly sophisticated software algorithms to correct the inter-elemental effects, the calibration of fundamental parameters has become more widespread. This method is widely used in the measurement of the thickness of the coatings and in the composition of the materials, as it is reliable, accurate and repeatable for a wide range of thicknesses, also for double or triple coatings.

Specifically:

•  Single coatings of Zn, Ni, Cr, Cu, Ag, Au, Sn of Ferrous bases, copper, brass and Zamak
•  Coatings of binary alloys, such as Sn/Pb on Copper, Zn/Ni and Ni/P on Fe.
•  Coatings of ternary alloys, such as Au on Cd Cu Ni, Pb Sn Ag based copper
•  Double coatings such as Au/Ni on Brass, Au/White Bronze on Brass, Au/Pd on Brass, Cr/Ni on Cu, etc.
•  Triple coatings: such as Cr/Ni/Cu, on a Zamak base, Ru/Pd/Ni on Brass
•  Metallurgical alloys composed of up to 24 constituents
• Analysis of the number of carats